Design for Test for Digital IC's and Embedded Core Systems Be the first to review this product In stock $38.36 Quick Overview Design for Test for Digital IC's and Embedded Core Systems Condition: 100% BRAND NEW Author: Alfred Crouch Edition: 1 International Publisher: Prentice Hall PTR International Pub. Date: July 2, 1999 Cover: Paperback International ISBN-13: 9780130848277 International ISBN-10: 0130848271 Quantity: Add to Cart Add To Wishlist Add To Compare « Back to Main Product Info Reviews Write Your Own Review Nickname* Summary* Review* Submit Review Be the first to review this product
