Characterization of Microstructures by Analytical Electron Microscopy (AEM)

Be the first to review this product

In stock

$42.47

Quick Overview

Characterization of Microstructures by Analytical Electron Microscopy (AEM)
Condition: 100% BRAND NEW
Author: Yonghua Rong
Edition: 1
International Publisher: Springer
International Pub. Date: April 28, 2012
Cover: Paperback
International ISBN-13: 9783642201189 / 9783642201202
International ISBN-10: 3642201180 / 3642201202

Reviews

Write Your Own Review

Be the first to review this product