Characterization of Microstructures by Analytical Electron Microscopy (AEM) Be the first to review this product In stock $42.47 Quick Overview Characterization of Microstructures by Analytical Electron Microscopy (AEM) Condition: 100% BRAND NEW Author: Yonghua Rong Edition: 1 International Publisher: Springer International Pub. Date: April 28, 2012 Cover: Paperback International ISBN-13: 9783642201189 / 9783642201202 International ISBN-10: 3642201180 / 3642201202 Quantity: Add to Cart Add To Wishlist Add To Compare « Back to Main Product Info Reviews Write Your Own Review Nickname* Summary* Review* Submit Review Be the first to review this product